Patrick Flynn

College of Engineering | March 5, 2016

Patrick J. Flynn, the Duda Family Professor of Engineering, professor of computer science and engineering, and concurrent professor of electrical engineering at the University of Notre Dame, has been named editor-in-chief for the IEEE Biometrics Compendium, the first virtual journal published by the Institute of Electrical and Electronics Engineers Biometrics Council.

Established in 2010 and published quarterly, the journal highlights specific areas of interest in biometrics — such as identification, verification, encryption, recognition, and medical diagnosis — while also providing commentary from experts in the field.

Read more here.

 by Daily Domer Staff

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